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摘要:
A new on-machine profiler employing a cantilever beam was proposed and developed to measure the sharp micro-cutting edges of precision cutting tools with low measuring force of 0.1 mN.The proposed profiler consists of a probe unit and a positioning unit.The probe unit employs a stylus mounted on the free end of a hollow triangular cantilever beam and a laser displacement sensor to detect the detlection of the cantilever beam.The positioning unit consists of two single-axis DC servo motor stages for precise positioning of the probe unit.The cantilever is designed with the assistance of the finite element method.In order to demonstrate the feasibility of the proposed measurement system,experiments are conducted and the measurement result for a micro-cutting edge is compared with that by a commercial profiler.Furthermore,a method to com-pensate for the measurement error caused by the lateral displacement of the cantilever beam is proposed.The compensated measurement results show good agreement within土2μm with those obtained by the commercial profler.
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篇名 Design and Construction of a Low-Force Stylus Probe for On-machlne Tool Cutting Edge Measurement
来源期刊 纳米制造与计量(英文) 学科 教育
关键词 On-machine measurement Surface profiler Micro-cutting edge Low-force measurement Cantilever beam
年,卷(期) 2020,(4) 所属期刊栏目
研究方向 页码范围 282-291
页数 10页 分类号 G63
字数 语种
DOI
五维指标
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研究主题发展历程
节点文献
On-machine
measurement
Surface
profiler
Micro-cutting
edge
Low-force
measurement
Cantilever
beam
研究起点
研究来源
研究分支
研究去脉
引文网络交叉学科
相关学者/机构
期刊影响力
纳米制造与计量(英文)
季刊
2520-811X
12-1463/TB
出版文献量(篇)
30
总下载数(次)
0
总被引数(次)
0
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